发明名称 Memory device having a transistor and one resistant element as a storing means and method for driving the memory device
摘要 A memory device having one transistor and one resistant element as a storing means and a method for driving the memory device, includes an NPN-type transistor formed on a semiconductor substrate, an interlayer insulating film formed on the semiconductor substrate to cover the transistor in which a contact hole exposing a source region of the transistor is formed, a resistant material in which a bit data "0" or "1" is written connected to the source region of the transistor by a conductive plug or an insulating film, and a conductive plate contacting the resistant material. The memory device exhibits improved degree of integration, reduced current consumption by lengthening a refresh period thereof, and enjoys simplified manufacturing process due to a simple memory cell structure.
申请公布号 US2005095775(A1) 申请公布日期 2005.05.05
申请号 US20040995116 申请日期 2004.11.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO IN-KYEONG;SEO SUN-AE;KIM HYUN-JO
分类号 H01L27/10;G11C11/401;G11C11/404;G11C16/04;H01L21/00;H01L21/822;H01L21/8246;H01L27/112;H01L29/792;H01L31/0328;H01L31/0336;H01L31/072;H01L31/109;H01L49/02;(IPC1-7):H01L21/00 主分类号 H01L27/10
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