发明名称 Ophthalmic wavefront measuring devices
摘要 Apparatuses and methods for improving aberration determination capabilities, providing corrective prescription verification, and allowing binocular vision correction in ophthalmic wavefront measuring devices. (1) Improved aberration determination capabilities are achieved through input beam modification which includes sensing an image in a wavefront emanating from an eye in response to an input beam with a sensor and then modifying the input beam with an adaptive optical device based on the sensed information. (2) Corrective prescription verification includes modifying an image with an adaptive optical element to produce a corrected image at the patients eye. (3) Binocular vision correction for a pair of eyes includes measuring the aberrations of one eye with a first ophthalmic wavefront measuring device and measuring the aberration produced by the other eye with a second ophthalmic wavefront measuring device substantially simultaneously.
申请公布号 US2005094100(A1) 申请公布日期 2005.05.05
申请号 US20040940372 申请日期 2004.09.14
申请人 ROSS DENWOOD F.;BILLE JOSEF;SCHOTTNER MICHAEL;MUELLER FRANK 发明人 ROSS DENWOOD F.;BILLE JOSEF;SCHOTTNER MICHAEL;MUELLER FRANK
分类号 G01M11/02;A61B3/028;A61B3/10;A61B3/103;G06T1/00;(IPC1-7):A61B3/10 主分类号 G01M11/02
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