发明名称 Sidewall formation for high density polymer memory element array
摘要 Systems and methodologies are disclosed for increasing the number of memory cells associated with a lithographic feature. The systems comprise memory elements that are formed on the sidewalls of the lithographic feature by employing various depositing and etching processes. The side wall memory cells can have a bit line of the wafer as the first electrode and operate with a second formed electrode to activate a portion of an organic matter that is formed there between.
申请公布号 US2005092983(A1) 申请公布日期 2005.05.05
申请号 US20030699903 申请日期 2003.11.03
申请人 LYONS CHRISTOPHER F.;CHANG MARK S.;LOPATIN SERGEY D.;SUBRAMANIAN RAMKUMAR;CHEUNG PATRICK K.;NGO MINH V.;OGLESBY JANE V. 发明人 LYONS CHRISTOPHER F.;CHANG MARK S.;LOPATIN SERGEY D.;SUBRAMANIAN RAMKUMAR;CHEUNG PATRICK K.;NGO MINH V.;OGLESBY JANE V.
分类号 G11C11/56;G11C13/02;H01L27/115;H01L27/28;H01L29/68;H01L45/00;H01L51/00;(IPC1-7):H01L29/73 主分类号 G11C11/56
代理机构 代理人
主权项
地址
您可能感兴趣的专利