发明名称 Triple gate device having strained-silicon channel
摘要 A three-dimensional Triple-Gate (Tri-gate) device having a three-sided strained silicon channel and superior drive current is provided. The Tri-gate device includes a composite fin structure consisting of a silicon germanium core and a three-sided strained silicon epitaxy layer grown from surface of said silicon germanium core. A gate strip wraps a channel portion of the composite fin structure. Two distal end portions of the composite fin structure not covered by the gate strip constitute source/drain regions of the Tri-gate device. A high quality gate insulating layer is interposed between the composite fin structure and the gate strip.
申请公布号 US6888181(B1) 申请公布日期 2005.05.03
申请号 US20040708694 申请日期 2004.03.18
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIAO WEN-SHIANG;SHIAU WEI-TSUN
分类号 H01L21/336;H01L29/786;H01L31/0328;(IPC1-7):H01L31/032 主分类号 H01L21/336
代理机构 代理人
主权项
地址