发明名称 |
SYSTEM FOR TESTING HARD DISK DRIVES |
摘要 |
A MULTI-TESTING SYSTEM FOR A NUMBER OF HARD DISK DRIVES (HDDS)(40) IS DESCRIBED. THE SYSTEM INCLUDES A HIGH TEMPERATURE BURN IN CHAMBER(30) FOR THE HDDS (60) AND A CONTROL CHAMBER, ISOLATED FROM THE BURN-IN CHAMBER BY A PARTITION WALL, FOR A PLURALITY OF HDD TEST COMPUTERS ELECTRICALLY CONNECTED WITH THE HDDS. EACH TEST COMPUTER HAS A PLURALITY OF ADAPTERS CONNECTED TO IT TO ALLOW DATA TRANSFER BETWEEN A PLURALITY OF THE HDDS AND THE HDD TEST COMPUTER. A HOST COMPUTER CONTROLS INTERNAL ENVIRONMENT OF THE BURN-IN CHAMBER AND THE HDD TEST COMPUTERS |
申请公布号 |
MY119177(A) |
申请公布日期 |
2005.04.30 |
申请号 |
MY1997PI01932 |
申请日期 |
1997.05.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
WOON-JUK PAEK;JEONG-MIN KANG;DAE-GEUN RYOO;YOUNG-BOK SUNG;CHANG-WOO NAM |
分类号 |
G11B27/36;G11B33/12;G01R31/28;G06F11/24;G06F11/267;G11B20/18;G11B25/04;G11B33/02 |
主分类号 |
G11B27/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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