发明名称 Method of forming a metal pattern for a semiconductor device
摘要 A method of forming a conductive pattern includes preparing a semiconductor substrate having a conductive pattern, forming an interlayer dielectric pattern having an opening exposing the conductive pattern on the semiconductor substrate, forming a metal layer on the interlayer dielectric pattern to fill the opening, wet etching the metal layer, and polishing the metal layer to form a metal pattern filling the opening. The wet etching is done such that a top surface of the interlayer dielectric pattern is not exposed.
申请公布号 US2005090094(A1) 申请公布日期 2005.04.28
申请号 US20040970297 申请日期 2004.10.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH JUN-HWAN;SON HONG-SEONG
分类号 H01L21/321;H01L21/3213;H01L21/768;(IPC1-7):H01L21/823;H01L21/311;H01L21/476 主分类号 H01L21/321
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