发明名称 X-RAY FOREIGN SUBSTANCE INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide easy maintenance for an X-ray foreign substance inspection apparatus. SOLUTION: The X-ray foreign substance inspection system 1, for inspecting an object to be inspected for foreign substances, using X-rays includes a cantilever frame 10 of which one end is a free end and of which the other end is a support end, by which a transfer mechanism 3, which moves the object to be inspected, and an X-ray detector 4 are supported. Using the cantilever frame provides a structure, having no support leg members on the side surface and the bottom surface of the system 1, allows tools and replacement parts to be inserted into the system without interference with the supporting leg members, and allows easy maintenance, such as repair, cleaning, and parts replacement of a transfer belt 33 and the X-ray detector or the like. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005114740(A) 申请公布日期 2005.04.28
申请号 JP20040366932 申请日期 2004.12.20
申请人 SHIMADZU CORP 发明人 HANAMI HIDENORI;HIRANO TAKAHIDE;KIMURA TAKAO
分类号 G01N23/04;G01N23/18;(IPC1-7):G01N23/04 主分类号 G01N23/04
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