| 摘要 |
The method involves determining the weight per unit area and/or chemical composition from an analysis of the radiation components of x-radiation scattered by the material specimen (5). The x-radiation from an x-ray source (20) is directed onto a spot (3) on the material and the scattered radiation produced by internal scattering is detected and evaluated by a detector arrangement (30). An independent claim is also included for a device for determining weight per unit area and/or chemical composition of a delivered material specimen. |
