发明名称 |
Method for producing a MOS transistor and MOS transistor |
摘要 |
A MOS transistor includes a drain zone, a source zone, and a gate electrode. Doping atoms of the first conductivity type are implanted in the region of the drain zone and the source zone by at least two further implantation steps such that a pn junction between the drain zone and a substrate region is vertically shifted and a voltage ratio of the MOS transistor between a lateral breakdown voltage and a vertical breakdown voltage can be set.
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申请公布号 |
US6884688(B2) |
申请公布日期 |
2005.04.26 |
申请号 |
US20020263097 |
申请日期 |
2002.10.02 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
ESMARK KAI;GOSSNER HARALD;MACKH GUNTHER;OWEN RICHARD;ZAENGL FRANZ |
分类号 |
H01L21/8238;H01L27/02;H01L29/08;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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