发明名称 MEMS differential actuated nano probe and method for fabrication
摘要 A MEMS differential actuated nano probe includes four suspension beams arranged in parallel, a connecting base connecting to the suspension beams, a nano probe. Two of the suspension beams elongate due to thermal expansion to allow the deflection of the probe. By heating the suspension beams at different positions, the MEMS differential actuated nano probe can move in two directions with two degrees of freedom. The deflection of the MEMS differential actuated nano probe can be also achieved in piezoelectric or electrostatic way.
申请公布号 US2005082474(A1) 申请公布日期 2005.04.21
申请号 US20040795407 申请日期 2004.03.09
申请人 WEN SHIH-YI;LEE HSIAO-WEN;WENG JUI-PING;CHEN MING-HUNG 发明人 WEN SHIH-YI;LEE HSIAO-WEN;WENG JUI-PING;CHEN MING-HUNG
分类号 G01Q60/18;G01Q60/24;G01Q60/46;G01Q60/50;G01Q70/16;(IPC1-7):G12B21/20 主分类号 G01Q60/18
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