发明名称 ALIGNER, PELLICLE ALTERNATIVE, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an aligner, a pellicle alternative, and a manufacturing method of a semiconductor device, for stably protecting the pattern of a photomask at a low cost with reliability. <P>SOLUTION: A wafer stage 18 on which a mask stage 14, a projection optical system 17, and a semiconductor wafer WF are placed is provided in a chamber 12 to which a lighting system 11 is provided. A detachable frame 15 along with a protective film 16 is provided to the mask stage 14. The protective film 16 comprises such material as at least transparent for illumination light without absorbing it. A photomask 13 required for exposure is transported into the chamber 12 from a stocker 20 by a transportation mechanism 19, and then set to the mask stage 14. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005109345(A) 申请公布日期 2005.04.21
申请号 JP20030343514 申请日期 2003.10.01
申请人 SEIKO EPSON CORP 发明人 SAKAMOTO ATSUSHI
分类号 G03F1/62;G03F7/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/14 主分类号 G03F1/62
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