发明名称 SEMICONDUCTOR DEVICE WITH NANOCLUSTERS
摘要 <p>A process of forming a device with nanoclusters. The process includes forming nanoclusters (e.g. silicon nanocrystals) and forming an oxidation barrier layer over the nanoclusters to inhibit oxidizing agents from oxidizing the nanoclusters during a subsequent formation of a dielectric of the device. At least a portion of the oxidation barrier layer is removed after the formation of the dielectric. In one example, the device is a memory wherein the nanoclusters are utilized as charge storage locations for charge storage transistors of the memory. In this example, the oxidation barrier layer protects the nanoclusters from oxidizing agents due to the formation of gate dielectric for high voltage transistors of the memory.</p>
申请公布号 WO2005036640(A1) 申请公布日期 2005.04.21
申请号 WO2004US22508 申请日期 2004.07.15
申请人 FREESCALE SEMICONDUCTOR, INC.;STEIMLE, ROBERT, F.;MURALIDHAR, RAMACHANDRAN;PAULSON, WAYNE, M.;RAO, RAJESH, A.;WHITE, BRUCE, E.;PRINZ, EDWARD, J. 发明人 STEIMLE, ROBERT, F.;MURALIDHAR, RAMACHANDRAN;PAULSON, WAYNE, M.;RAO, RAJESH, A.;WHITE, BRUCE, E.;PRINZ, EDWARD, J.
分类号 H01L21/8238;H01L27/115;H01L29/423;H01L21/28;H01L21/336;(IPC1-7):H01L21/823 主分类号 H01L21/8238
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