| 摘要 |
The present invention relates to an automated and high precision technique for measuring focal distances in microlenses. Said technique consisting in focusing a laser beam on the microlens that is under inspection, the focusing action is carried out in a single stage by means of a singlet-type lens. The beam is refracted by the microlens and directed to a photodiode having a sensitive area that is semi-blocked by a vibrating edge placed facing the photodiode. The amplitude of the output signal of the photodiode presenting the aforementioned conditions is proportional to the focal distance of the microlens under inspection.
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