发明名称 Vernier calipers or micrometer for measuring linear dimensions of an object have an additional torque sensor for measuring mechanical deformation or tilting so that it can be compensated for in dimensional measurements
摘要 Device for measuring linear dimensions of an object has a measurement surface (113) on a guided element (105) or a fixed base body (104) on which a force or torque measurement sensor is (112) attached, the output signal of which is connected to an electronic measurement arrangement (116, 118) in order to enable compensation of deformation or tilting of the measurement surface. - The invention also relates to a corresponding measurement method.
申请公布号 DE10322357(B4) 申请公布日期 2005.04.14
申请号 DE20031022357 申请日期 2003.05.09
申请人 HELIOS MESSTECHNIK GMBH & CO. KG 发明人 STEIN, OLIVER;STUEBER, JOERG;WOLF, GERHARD
分类号 G01B3/18;G01B3/20;G01D21/02;G01L5/22;(IPC1-7):G01B3/20;G01D3/08;G01L1/22;G01L3/10 主分类号 G01B3/18
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