发明名称 |
Vernier calipers or micrometer for measuring linear dimensions of an object have an additional torque sensor for measuring mechanical deformation or tilting so that it can be compensated for in dimensional measurements |
摘要 |
Device for measuring linear dimensions of an object has a measurement surface (113) on a guided element (105) or a fixed base body (104) on which a force or torque measurement sensor is (112) attached, the output signal of which is connected to an electronic measurement arrangement (116, 118) in order to enable compensation of deformation or tilting of the measurement surface. - The invention also relates to a corresponding measurement method.
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申请公布号 |
DE10322357(B4) |
申请公布日期 |
2005.04.14 |
申请号 |
DE20031022357 |
申请日期 |
2003.05.09 |
申请人 |
HELIOS MESSTECHNIK GMBH & CO. KG |
发明人 |
STEIN, OLIVER;STUEBER, JOERG;WOLF, GERHARD |
分类号 |
G01B3/18;G01B3/20;G01D21/02;G01L5/22;(IPC1-7):G01B3/20;G01D3/08;G01L1/22;G01L3/10 |
主分类号 |
G01B3/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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