Thickness measurement device for use in quality control of manufactured products has a SQUID measurement sensor operating in conjunction with an alternating magnetic field generation arrangement

摘要

Thickness measurement arrangement for measuring the thickness of a material sample (78) has a SQUID (super conducting quantum interference device) measurement sensor (10), i.e. a super conducting quantum interferometer. The invention is based on the discovery that the magnetic field strength of the sensor is dependent on the thickness of the material being measured.