发明名称 THIN FILM DEPOSITION METHOD AND THIN FILM DEPOSITION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a thin film deposition method where a gaseous starting material obtained by vaporizing an organic titanium compound and an added gas reacted therewith are fed into a reaction vessel, and a titanium nitride thin film is produced on the surface of a heated substrate using a chemical vapor deposition, by which, in the case the temperature of the substrate äe.g., a semiconductor substrate such as a CMOS (complementary metal oxide semiconductor) substrate} is controlled to a low temperature region of 150 to 230°C as the heat resisting temperature of various functional materials, a practical film deposition rate can be obtained, and covering properties are also satisfactory, and to provide a thin film deposition system using the method. SOLUTION: In the thin film deposition method, a substrate is heated to the temperature range of 150 to 230°C, and the partial pressure P<SB>added gas</SB>of an added gas to the partial pressure P<SB>organometallic gas</SB>of a gaseous starting material obtained by vaporizing an organic titanium compound is set to the range of 10≤P<SB>added gas</SB>/P<SB>organometallic gas</SB>. The thin film deposition system uses the method. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005097660(A) 申请公布日期 2005.04.14
申请号 JP20030331391 申请日期 2003.09.24
申请人 ANELVA CORP 发明人 KOIDE TOMOAKI;SEKIGUCHI ATSUSHI;MURAO YUKINOBU
分类号 B81C1/00;C23C16/18;C23C16/34;(IPC1-7):C23C16/18 主分类号 B81C1/00
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