发明名称 |
COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR AND METHOD FOR FABRICATING THEREOF |
摘要 |
A CMOS(complementary metal oxide semiconductor) image sensor is provided to prevent a characteristic of a device from being deteriorated by crosstalk by effectively irradiating the light having transmitted each lens part of a micro lens to a photodiode of a corresponding CMOS device. A semiconductor substrate(10) is prepared. An isolation part(16) is supplied to the semiconductor substrate to form an isolation region. A photocharge generating part is formed between the isolation parts to receive incident light from the outside and generate and accumulate charges. A light collecting part collects the light from the outside and irradiates the collected light to a corresponding photocharge generating part, installed over the photocharge generating part. A crosstalk blocking part prevents the light having transmitted the light collecting part from being irradiated to an adjacent photochrage generating part adjacent to the corresponding photocharge generating part.
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申请公布号 |
KR20050032448(A) |
申请公布日期 |
2005.04.07 |
申请号 |
KR20030068503 |
申请日期 |
2003.10.01 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
JEON, IN GYUN |
分类号 |
H01L27/00;H01L27/146;H01L31/00;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/00 |
代理机构 |
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地址 |
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