发明名称 COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR AND METHOD FOR FABRICATING THEREOF
摘要 A CMOS(complementary metal oxide semiconductor) image sensor is provided to prevent a characteristic of a device from being deteriorated by crosstalk by effectively irradiating the light having transmitted each lens part of a micro lens to a photodiode of a corresponding CMOS device. A semiconductor substrate(10) is prepared. An isolation part(16) is supplied to the semiconductor substrate to form an isolation region. A photocharge generating part is formed between the isolation parts to receive incident light from the outside and generate and accumulate charges. A light collecting part collects the light from the outside and irradiates the collected light to a corresponding photocharge generating part, installed over the photocharge generating part. A crosstalk blocking part prevents the light having transmitted the light collecting part from being irradiated to an adjacent photochrage generating part adjacent to the corresponding photocharge generating part.
申请公布号 KR20050032448(A) 申请公布日期 2005.04.07
申请号 KR20030068503 申请日期 2003.10.01
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 JEON, IN GYUN
分类号 H01L27/00;H01L27/146;H01L31/00;(IPC1-7):H01L27/146 主分类号 H01L27/00
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