发明名称 |
PHASE ANALYSIS METHOD OF INTERFERENCE PATTERN OR PROJECTION GRID USING ALIASING |
摘要 |
PROBLEM TO BE SOLVED: To provide a phase analysis method capable of analyzing phase of interference pattern or projection grid with a smaller number of samplings. SOLUTION: The phase of interference pattern or projection grid is analyzed from the image obtained by imaging f<SB>sam</SB>times while the phase of the interference pattern or projection grid is changed by 2πf, with f and f<SB>sam</SB>being natural numbers and f<SB>sam</SB><2N. The phase of interference pattern or projection grid is acquired as an argument of complex number which is acquired by Fourier transform with the frequency generated by aliasing which is given with f'=f±kf<SB>sam</SB>, with k being an arbitrary natural number. COPYRIGHT: (C)2005,JPO&NCIPI
|
申请公布号 |
JP2005091325(A) |
申请公布日期 |
2005.04.07 |
申请号 |
JP20030328990 |
申请日期 |
2003.09.19 |
申请人 |
WAKAYAMA UNIV |
发明人 |
MORIMOTO YOSHIHARU;FUJIGAKI MOTOHARU;YONEYAMA SATOSHI;YAMAMOTO HIROKO;IKEDA YASUYUKI |
分类号 |
G01B11/24;G01J9/02;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|