| 发明名称 |
DISTRIBUTED INSPECTION APPARATUS AND HOST INSPECTION APPARATUS |
| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an inspection apparatus for realizing an advanced inspection and high-quality disposition by performing inspection by dispersely installed pieces of apparatus and facilities. <P>SOLUTION: A distributed inspection apparatus formed in a network system in which a host inspection apparatus is connected so that the distributed inspection apparatus can be connected comprises an inspection section for inspecting the gene information of a specimen; a transmission section for transmitting inspection result information at the inspection section, and a specimen ID corresponding to the specimen to the host inspection apparatus via the network; a reception section for receiving evaluation information from the host inspection apparatus corresponding to the transmitted inspection result information from the network; and an output section for outputting the received information. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
| 申请公布号 |
JP2005091117(A) |
申请公布日期 |
2005.04.07 |
| 申请号 |
JP20030323868 |
申请日期 |
2003.09.17 |
| 申请人 |
HITACHI LTD |
发明人 |
INAMI HISAO;SASAKI YASUHIKO;KATO SO;MIYAKE AKIRA |
| 分类号 |
G01N33/50;G01N21/27;G01N35/00;G06F11/00;G06F11/273;G06F19/18;G06Q50/00;G06Q50/10;G06Q50/22;(IPC1-7):G01N35/00;G06F17/60 |
主分类号 |
G01N33/50 |
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