发明名称 2-TRANSISTOR MEMORY CELL AND METHOD FOR MANUFACTURING
摘要 The present invention provides a method of manufacturing on a substrate (50) a 2-transistor memory cell comprising a storage transistor (1) having a memory gate stack (1) and a selecting transistor, there being a tunnel dielectric layer (51) between the substrate (50) and the memory gate stack. (1). The method comprises forming the memory gate stack (1) by providing a first conductive layer (52) and a second conductive layer (54) and etching the second conductive layer (54) thus forming a control gate and etching the first conductive layer (52) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer (52), forming spacers (81) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer (51), and thereafter using the spacers (81) as a hard mask to etch the first conductive layer (52) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate (54) is smaller than the floating gate (52), and spacers (81) are present next to the control gate (54).
申请公布号 WO2005031859(A1) 申请公布日期 2005.04.07
申请号 WO2004IB51795 申请日期 2004.09.20
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;VAN SCHAIJK, ROBERTUS, T., F.;SLOTBOOM, MICHIEL 发明人 VAN SCHAIJK, ROBERTUS, T., F.;SLOTBOOM, MICHIEL
分类号 H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788 主分类号 H01L21/28
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