发明名称 Semi-conductor wafer fabrication
摘要 A method of planarizing a semiconductor wafer includes applying a CMP process to a layer of dielectric material to planarize the wafer surface, and applying a plasma etching process to the wafer surface until a signal is generated from a detection layer that indicates that said detection layer has been removed from underlying features disposed on the water.
申请公布号 US2005074907(A1) 申请公布日期 2005.04.07
申请号 US20030679841 申请日期 2003.10.06
申请人 KRIZ ADRIAN;MONROE MICHAEL 发明人 KRIZ ADRIAN;MONROE MICHAEL
分类号 H01L21/00;H01L21/3105;H01L21/66;(IPC1-7):H01L21/00 主分类号 H01L21/00
代理机构 代理人
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