Verfahren zur Bestimmung von Schichtdickenbereichen,申请号DE20021027376-传众专利搜索

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发明名称	Verfahren zur Bestimmung von Schichtdickenbereichen
摘要
申请公布号	DE10227376(B4)	申请公布日期	2005.03.31
申请号	DE20021027376	申请日期	2002.06.20
申请人	LEICA MICROSYSTEMS JENA GMBH	发明人	MIKKELSEN, HAKON;WIENECKE, JOACHIM
分类号	G01B11/06;(IPC1-7):G01B11/06	主分类号	G01B11/06
代理机构		代理人
主权项
地址

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