| 发明名称 |
SIGNAL INTEGRITY SELF-TEST ARCHITECTURE |
| 摘要 |
A method suitable for testing an integrated circuit device is disclosed, the device comprising at least one module (47), wherein the at least one module incorporates at least one associated module monitor (49, 51, 53, 55) suitable for monitoring a device parameter such as temperature, supply noise, cross-talk etc. within the module. |
| 申请公布号 |
WO2004106957(A3) |
申请公布日期 |
2005.03.31 |
| 申请号 |
WO2004IB50731 |
申请日期 |
2004.05.18 |
| 申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V.;VEENDRICK, HENDRICUS, J., M. |
发明人 |
VEENDRICK, HENDRICUS, J., M. |
| 分类号 |
G01R31/30;G01R31/317;G01R31/3185;G01R31/319;G11C29/50 |
主分类号 |
G01R31/30 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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