发明名称 BAND DISTRIBUTION INSPECTION DEVICE AND BAND DISTRIBUTION INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a band distribution inspection device and a band distribution inspection method for inspecting quickly, simply and inexpensively whether a diffused oscillation signal oscillated, including frequency fluctuation from a fundamental frequency based on the fundamental frequency, has a prescribed band distribution. SOLUTION: The diffused oscillation signal S<SB>ss</SB>inputted into a band distribution detection part 22 is outputted as a prescribed band passing signal S<SB>BP</SB>through a band-pass filter 17 having a prescribed passing band with a prescribed narrow band widthΔf in the band distribution, converted into an effective value by a smoothing device 19, smoothed by a capacitor C1, and transferred to a general-purpose inspection device 21 as a DC signal S<SB>AV</SB>. The DC signal S<SB>AV</SB>is compared with a prescribed voltage value V<SB>x</SB>by a comparator 25, and the comparison result is subjected to quality determination by a determination part 27 and outputted as a determination signal J. Inspection of the end frequency in the band distribution of the diffused oscillation signal S<SB>ss</SB>or inspection of disturbance of the frequency fluctuation, waveform dullness or the like inside/outside the band are performed. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005084007(A) 申请公布日期 2005.03.31
申请号 JP20030319243 申请日期 2003.09.11
申请人 FUJITSU LTD 发明人 ONO TAIICHI;OKADA KOJI;MATSUNAMI HIROYUKI
分类号 G01R23/165;G01R19/00;G01R23/00;G01R31/28;(IPC1-7):G01R23/165 主分类号 G01R23/165
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