发明名称 Variable temperature and dose atomic layer deposition
摘要 A variable temperature and/or reactant dose atomic layer deposition (VTD-ALD) process modulates ALD reactor conditions (e.g., temperature, flow rates, etc.) during growth of a film (e.g., metallic) on a wafer to produce different film properties a different film depths.
申请公布号 US2005070121(A1) 申请公布日期 2005.03.31
申请号 US20030674883 申请日期 2003.09.30
申请人 KUSE RONALD JOHN 发明人 KUSE RONALD JOHN
分类号 H01L21/31;C23C16/455;C23C16/52;H01L21/285;H01L21/314;(IPC1-7):H01L21/31;H01L21/469 主分类号 H01L21/31
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