Method of testing RF circuit, and arrangement

摘要

A test method and an arrangement for testing an RF circuit of a wireless device are provided. The test arrangement includes providing means connected to the RF circuit, the providing means for providing the RF circuit to be tested with an input test signal, thus generating an RF output test signal characterizing the response of the RF circuit, and down-converting means connected to the RF circuit and integrated at least partially into the RF circuit, the down-converting means for down-converting the RF output test signal to a BB frequency, thus generating a BB output test signal. The invention provides access to the RF circuit by using relatively simple test instrumentation operating at a base band frequency.