发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <p>A lithographic apparatus and a method of manufacturing a device are provided to control exactly discretely the flatness of an active surface in a patterning member by using a height controlling structure. A lithographic apparatus(200) includes an illumination system, a patterning array, a mounting plate, a height controlling structure, a substrate table and a projection system. The illumination system(202) supplies a projective beam of radiation. The patterning array(204) is used for patterning the projective beam. The patterning array is composed of a plurality of elements. Each element is capable of being discretely controlled. The mounting plate is used for mounting the patterning array. The height controlling structure is used for controlling locally the height of an active surface in the patterning array. The substrate table supports a substrate. The projection system(210) is used for projecting the patterned beam to a target.</p>
申请公布号 KR20050029695(A) 申请公布日期 2005.03.28
申请号 KR20040075337 申请日期 2004.09.21
申请人 ASML HOLDING N.V.;ASML NETHERLANDS B.V. 发明人 BLEEKER, ARNO JAN;FRANKEN, DOMINICUS JACOBUS PETRUS ADRIANUS;TROOST, KARS ZEGER;KOCHERSPERGER, PETER C.
分类号 G02B26/08;G02B5/10;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G02B26/08
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