| 摘要 |
PROBLEM TO BE SOLVED: To easily and quickly measure flatness of a master carrier for magnetic transfer. SOLUTION: This instrument is an instrument for measuring the flatness of the master carrier for the magnetic transfer for transferring preformat information in response to uneven shapes formed in a preformat information forming area, onto a slave carrier, when brought into close contact with the slave carrier and impressed with a magnetic field for transfer. The instrument is provided with a transparent base panel 11 with parallel upper and under faces and with the underface brought into close contact with the master carrier 3 for the magnetic transfer, a pressing means for pressing the underface of the transparent base panel 11 onto the master carrier 3 for the magnetic transfer to contact closely, and a light incident means for making a prescribed wavelength of light get incident from the upper face of the transparent base panel 11 into a master carrier 3 side for the magnetic transfer. An interference fringe is observed thereby when a clearance is generated between the the underface of the transparent base panel 11 and the master carrier 3 for the magnetic transfer, and a size of the clearance is calculated based on spacing in the interference fringe. COPYRIGHT: (C)2005,JPO&NCIPI
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