发明名称 Dual mask capacitor for integrated circuits
摘要 An embodiment of the invention is a capacitor comprising a bottom electrode 70 coupled to a first interconnect 30a of the top metal level 10, a capacitor dielectric 90, sidewalls 105, and a top electrode 110 coupled to a second interconnect 30b of the top metal level 10. Another embodiment of the invention is a method of manufacturing a capacitor using a first mask 140 to form a material stack that includes a bottom electrode 70 coupled to a first interconnect 30a of the top metal level 10, a capacitor dielectric 90, and a partial top electrode 100. The method further includes using a second mask 150 to form a complete top electrode coupled to a second interconnect 30b of the top metal level 10.
申请公布号 US2005063138(A1) 申请公布日期 2005.03.24
申请号 US20040831471 申请日期 2004.04.23
申请人 ROST TIMOTHY A.;BURKE EDMUND;PAPA RAO SATYAVOLU S.;KEAGY ROSE ALYSSA 发明人 ROST TIMOTHY A.;BURKE EDMUND;PAPA RAO SATYAVOLU S.;KEAGY ROSE ALYSSA
分类号 H01L21/02;H01L21/768;(IPC1-7):H01G4/228 主分类号 H01L21/02
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