| 摘要 |
A device interface unit which gives a device to be tested a test signal for testing the device to be tested and receives an output signal from the device to be tested, and which comprises a pin electronics substrate, a substrate-side connector that is provided at the end of the pin electronics substrate and has a plurality of substrate-side core wires and a substrate-side shield, a socket for holding the device to be tested, a socket-side connector having a plurality of socket-side core wires and a socket-side shield, and a cable unit for transmitting a transmission signal between the socket and the pin electronics substrate, wherein the cable unit has a substrate fitting connector, a socket fitting connector and a plurality of transmission cables.
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