发明名称 Method of plating a metal or metal or metal compound on a semiconductor substrate that includes using the same main component in both plating and etching solutions
摘要 A method of forming a copper oxide film including forming a copper oxide film including an ammonia complex by causing a mixed solution of aqueous ammonia and aqueous hydrogen peroxide, which has been adjusted to have pH of 8 to 10 or pH of 9 to 10, to contact a surface of a copper film. A method of fabricating a semiconductor device including burying a copper film to be a wiring or a contact wiring in a wiring groove or a contact hole formed in a surface of an insulating film formed on a semiconductor substrate, or in both the wiring groove and the contact hole, forming a copper oxide film including an ammonia complex on a surface of the copper film by using the copper oxide film forming method, and removing the copper oxide film from the copper film using acid or alkali.
申请公布号 US2005064700(A1) 申请公布日期 2005.03.24
申请号 US20040976758 申请日期 2004.11.01
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 UOZUMI YOSHIHIRO
分类号 H01L21/308;C23C22/63;H01L21/28;H01L21/288;H01L21/3205;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/308
代理机构 代理人
主权项
地址