| 摘要 |
A scheme for testing an electrical device to determine a range of combinations of values of N parametric variables, i.e., a SHMOO plot, for which the device functions properly. In one embodiment, the method comprises defining an N-dimensional plot region comprising a plurality of operating points each corresponding to a particular combination of values of the N parametric variables. The plot region is successively subdivided into smaller sub-regions, based on determining whether the electrical device passes or fails upon testing at each operating point of a predetermined subset of operating points of the plot region or one of the smaller sub-regions, until a minimum resolution is achieved.
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