发明名称 |
Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor |
摘要 |
Method and system for periodically measuring the junction temperature of a semiconductor device. The junction exited by at least two sequential predetermined currents of different magnitudes the voltage response of the junction to the at least two currents is measured and the temperature of the junction is calculated, while substantially canceling ohmic effects, by using the voltage response and a correction factor obtained by periodically. Whenever desired, the junction is exited by a set of at least four sequential different currents having known ratios. The voltage response to the set is measured and the correction factor is calculated by using each voltage response to the set.
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申请公布号 |
US6870357(B1) |
申请公布日期 |
2005.03.22 |
申请号 |
US20020301831 |
申请日期 |
2002.11.21 |
申请人 |
NATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
FALIK OHAD |
分类号 |
G01K7/01;G01K15/00;(IPC1-7):G01N27/00 |
主分类号 |
G01K7/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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