发明名称 Semiconductor-on-insulator chip incorporating strained-channel partially-depleted, fully-depleted, and multiple-gate transistors
摘要 In accordance with a preferred embodiment of the present invention, a silicon-on-insulator (SOI) chip includes a silicon layer of a predetermined thickness overlying an insulator layer. A multiple-gate fully-depleted SOI MOSFET including a strained channel region is formed on a first portion of the silicon layer. A planar SOI MOSFET including a strained channel region formed on another portion of the silicon layer. For example, the planar SOI MOSFET can be a planar fully-depleted SOI (FD-SOI) MOSFET or the planar SOI MOSFET can be a planar partially-depleted SOI (PD-SOI) MOSFET.
申请公布号 US6867433(B2) 申请公布日期 2005.03.15
申请号 US20030426566 申请日期 2003.04.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YEO YEE-CHIA;CHEN HOW-YU;HUANG CHIEN-CHAO;LEE WEN-CHIN;YANG FU-LIANG;HU CHENMING
分类号 H01L21/336;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/336
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