发明名称 Semiconductor device and method of manufacturing the same
摘要 A barrier layer that meets three requirements, "withstand well against etching and protect a semiconductor film from an etchant as an etching stopper", "allow impurities to move in itself during heat treatment for gettering", and "have excellent reproducibility", is formed and used to getter impurities contained in a semiconductor film. The barrier layer is a silicon oxide film and the ratio of a sub-oxide contained in the barrier layer is 18% or higher.
申请公布号 US6867077(B2) 申请公布日期 2005.03.15
申请号 US20030400418 申请日期 2003.03.28
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;SHARP KABUSHIKI KAISHA 发明人 NAKAZAWA MISAKO;ICHIJO MITSUHIRO;HAMATANI TOSHIJI;OHNUMA HIDETO;MAKITA NAOKI
分类号 H01L21/20;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L21/00 主分类号 H01L21/20
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