发明名称 |
Heterojunction bipolar transistor structure |
摘要 |
A material made by arranging layers of gallium-arsenide-antimonide (GaAsxSb1-x, 0.0<=x<=1.0) and/or indium-gallium-arsenic-nitride (InyGa1-yAszN1-z, 0.0<=y, z<=1.0) in a specific order is used to form the transistor base of a heterojunction bipolar transistor. By controlling the compositions of the materials indium-gallium-arsenic-nitride and gallium-arsenide-antimonide, and by changing the thickness and order of the layers, the new material would possess a specific energy gap, which in turn determines the base-emitter turn-on voltage of the heterojunction bipolar transistor.
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申请公布号 |
US2005051799(A1) |
申请公布日期 |
2005.03.10 |
申请号 |
US20040934891 |
申请日期 |
2004.09.03 |
申请人 |
HUANG CHAO-HSING;CHIN YU-CHUNG;TSENG MIN-NAN;YANG HUAI-TUNG;LIN KUN-CHUAN;TSAI SHIH-JANE |
发明人 |
HUANG CHAO-HSING;CHIN YU-CHUNG;TSENG MIN-NAN;YANG HUAI-TUNG;LIN KUN-CHUAN;TSAI SHIH-JANE |
分类号 |
H01L21/331;H01L29/10;H01L29/15;H01L29/20;H01L29/201;H01L29/205;H01L29/737;(IPC1-7):H01L29/739 |
主分类号 |
H01L21/331 |
代理机构 |
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