发明名称 QUALITY INSPECTION DEVICE OF LIQUID CRYSTAL SUBSTRATE, QUALITY INSPECTION METHOD OF LIQUID CRYSTAL SUBSTRATE, MANUFACTURE DEVICE OF LIQUID CRYSTAL SUBSTRATE, AND MANUFACTURING METHOD OF LIQUID CRYSTAL SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To make efficient manufacture of a liquid crystal substrate for forming a display cell by packing of a liquid crystal member. <P>SOLUTION: In consideration of the fact that presence of a cavity or gap unevenness in the display cell in the liquid crystal substrate 8 can be optically identified, a pickup pattern obtained via a polarizing plate 72 is compared with first and second threshold values L1 and L2 to perform determination whether the obtained luminosity level is in the range between the first and the second threshold values L1 and L2 to be a standard range. When the pickup pattern has an area over the first threshold value L1, a dropping amount in a liquid crystal dropping part 3 is increased, for example, and when the pickup pattern has the area under the second threshold value L2, pressurizing force of a pressing mechanism in a substrate sticking part 4 is increased. Thus, presence of the cavity and presence of gap unevenness in the display cell of the liquid crystal substrate are suppressed or canceled to improve yield in the manufacture of the liquid crystal substrate. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005062501(A) 申请公布日期 2005.03.10
申请号 JP20030292877 申请日期 2003.08.13
申请人 SHIBAURA MECHATRONICS CORP 发明人 TAKAHASHI TAKASHI
分类号 G02F1/13;G02F1/1335;G02F1/1339;G02F1/1341 主分类号 G02F1/13
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