发明名称 Semiconductor wafer processing method and processing apparatus
摘要 A method of processing a semiconductor wafer having circuits which are formed in a plurality of rectangular areas sectioned by streets arranged in a lattice pattern on the front surface, comprising: a grinding step of grinding the back surface of the semiconductor wafer to a predetermined thickness; and an oxide film forming step of forming an oxide film on the back surface of the semiconductor wafer ground to the predetermined thickness.
申请公布号 US2005054274(A1) 申请公布日期 2005.03.10
申请号 US20040934553 申请日期 2004.09.07
申请人 KAJIYAMA KEIICHI 发明人 KAJIYAMA KEIICHI
分类号 H01L21/304;H01L21/00;H01L21/301;H01L21/316;H01L21/68;H01L21/78;(IPC1-7):B24B1/00 主分类号 H01L21/304
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