发明名称 Device for measuring substrate temperature has polygonal stop with essentially straight edges between substrate, radiation detector to restrict detector field of view
摘要 The device has at least one radiation detector for measuring the radiation emitted by the substrate and a stop (19) for restricting the field of view of the detector arranged between the substrate and detector, whereby the edges (20) of the stop are essentially straight. A polygonal stop is used.
申请公布号 DE19905524(B4) 申请公布日期 2005.03.03
申请号 DE19991005524 申请日期 1999.02.10
申请人 STEAG RTP SYSTEMS GMBH 发明人 HAUF, MARKUS
分类号 G01J5/00;G01J5/08;(IPC1-7):G01J5/08;H01L21/66 主分类号 G01J5/00
代理机构 代理人
主权项
地址