CRYSTAL SAMPLE HOLDER AND CRYSTAL EVALUATION SYSTEM

摘要

PROBLEM TO BE SOLVED: To measure and evaluate a lot of crystal samples easily and rapidly. SOLUTION: A crystal sample holder which is set on a sample stage of an X-ray diffraction system, is provided with a holder main body 2; a plurality of sample mount sections 3 formed on the holder main body 2; and a sample rotating mechanism which rotates each sample mount section 3 along a prescribed direction. The sample rotating mechanism is made up so as to rotate a sample held on the sample mount section 3 around an axis of rotation which intersects a prescribed axisωin the X-ray diffraction system where an X-ray source and an X-ray detector are rotated on the axisω. COPYRIGHT: (C)2005,JPO&NCIPI