发明名称 PROCESS FOR PRODUCING SINGLE CRYSTAL AND SILICON SINGLE CRYSTAL WAFER
摘要 <p>A process for producing a single crystal, comprising encircling with straightening pipe (4) single crystal (3) having been pulled up from raw material melt (2) while effecting downflow of an inert gas in chamber (1) of single crystal pullup apparatus (11) according to the Czochralski method, characterized in that at the pullup of single crystal of N region outside OSF region occurring in ring form in the direction of diameter of the single crystal, the single crystal of N region is pulled up under conditions such that providing that D(mm) refers to the diameter of single crystal pulled up, the flow rate of inert gas in the interstice between the single crystal and the straightening pipe is 0.6D(L/min) or higher and such that the pressure within the chamber is 0.6D(hPa) or below. It is preferred that as the straightening pipe, use be made of one whose Fe concentration in at least surface portion is 0.05 ppm or less. Thus, there is provided a process for producing a single crystal wherein in the production of a single crystal by the use of an apparatus fitted with straightening pipe according to the CZ method, there can be realized low defect occurrence and suppression of Fe concentration even in circumferential portion to 1x10<10> atoms/cm<3> or below.</p>
申请公布号 WO2005019506(A1) 申请公布日期 2005.03.03
申请号 WO2004JP11685 申请日期 2004.08.13
申请人 SHIN-ETSU HANDOTAI CO., LTD.;FUSEGAWA, IZUMI;MITAMURA, NOBUAKI;YANAGIMACHI, TAKAHIRO 发明人 FUSEGAWA, IZUMI;MITAMURA, NOBUAKI;YANAGIMACHI, TAKAHIRO
分类号 C30B15/20;C30B29/06;(IPC1-7):C30B29/06;C30B15/00 主分类号 C30B15/20
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