发明名称 |
Test arrangement for an integrated circuit |
摘要 |
Arrangement for testing an integrated circuit with a combinational logic circuit. The combination logic unit is tested by comparison of its behavior with test software that emulates the theoretical behavior of the circuit. The test software comprises two identical software modules (11, 16) for the combinational logic circuit, with a test pattern applied to the first module and its output signals connected to the second module. |
申请公布号 |
EP1179738(B1) |
申请公布日期 |
2005.03.02 |
申请号 |
EP20010000353 |
申请日期 |
2001.08.08 |
申请人 |
PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
HAPKE, FRIEDRICH |
分类号 |
G01R31/28;G01R31/3185;H01L21/82;H01L21/822;H01L27/04 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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