发明名称 |
SOLID STATE IMAGING DEVICE AND MANUFACTURING METHOD THEREOF CAPABLE OF PREVENTING OXIDATION OF TRANSFER ELECTRODES USING SIDEWALL INSULATING LAYER |
摘要 |
PURPOSE: A solid state imaging device and a manufacturing method thereof are provided to minimize a size of the imaging device by preventing oxidation of transfer electrodes using a sidewall insulating layer on side portions of the transfer electrodes. CONSTITUTION: A solid state imaging device includes a charge transfer portion, a plurality layers of charge transfer electrodes(2A,2B), and sidewall insulating layers(8,11). The charge transfer portion is provided on one side of a light-receiving portion. The charge transfer portion is composed of plural layers of charge transfer electrodes. The sidewall insulating layers are formed on side surfaces of the charge transfer electrodes of respective layers of the charge transfer electrodes.
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申请公布号 |
KR20050019035(A) |
申请公布日期 |
2005.02.28 |
申请号 |
KR20040062750 |
申请日期 |
2004.08.10 |
申请人 |
SONY CORPORATION |
发明人 |
KOKUBUN, KATSUNORI;SATO, MITSURU |
分类号 |
H01L21/28;H01L21/339;H01L27/14;H01L27/146;H01L27/148;H01L29/762;H01L31/10;H04N5/335;(IPC1-7):H01L27/148 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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