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发明名称
ELECTRONIC CIRCUIT WITH TEST UNIT FOR TESTING INTERCONNECTS
摘要
申请公布号
KR20050016992(A)
申请公布日期
2005.02.21
申请号
KR20057000241
申请日期
2005.01.06
申请人
发明人
分类号
G01R31/3185;(IPC1-7):G01R31/318
主分类号
G01R31/3185
代理机构
代理人
主权项
地址
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