发明名称 [METHOD FOR FORMING AN OXIDE/ NITRIDE/OXIDE STACKED LAYER]
摘要 A method for fabricating a silicon oxide/silicon nitride/silicon oxide stacked layer structure is described. A bottom oxide layer is formed over a substrate. A surface treatment is then performed on the first silicon oxide layer to form an interface layer over the bottom oxide layer. The surface treatment is conducted in a nitrogen ambient. Thereafter, a silicon nitride layer is formed over the interface layer, followed by forming an upper silicon oxide layer over the silicon nitride layer.
申请公布号 US2005037578(A1) 申请公布日期 2005.02.17
申请号 US20030604764 申请日期 2003.08.14
申请人 CHEN WEI WEN;HAN TZUNG-TING;YANG YUN-CHI;YANG LING-WUU;CHEN KUANG-CHAO 发明人 CHEN WEI WEN;HAN TZUNG-TING;YANG YUN-CHI;YANG LING-WUU;CHEN KUANG-CHAO
分类号 H01L21/28;H01L21/314;(IPC1-7):H01L21/336;H01L21/31;H01L21/469;H01L21/76 主分类号 H01L21/28
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