发明名称 High voltage transistor and method of manufacturing the same
摘要 The present invention relates to a high voltage transistor and method of manufacturing the same. The high voltage transistor includes: a channel region which is formed in a semiconductor substrate; a gate insulating film which is formed on the channel region of the semiconductor substrate; a low concentration source region and a low concentration drain region having the channel region interposed therebetween and each being formed in the semiconductor substrate; a high concentration source region which is formed to be spaced away from the channel region by a first distance; a high concentration drain region which is formed to be spaced away from the channel region by a second distance that is larger than the first distance; a gate electrode which has a gate bottom portion interfacing with the gate insulating film over the channel region, and a gate top portion integrated with the gate bottom portion and protruding by a predetermined length from a top of the gate bottom portion to extend over the low concentration drain region; a first metal silicide layer which is formed on the high concentration source region; and a second metal silicide layer which is formed on the high concentration drain region.
申请公布号 US2005035404(A1) 申请公布日期 2005.02.17
申请号 US20040899371 申请日期 2004.07.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YU TAE-KWANG;JEON HEE-SEOG;YOON SEUNG-BEOM;KIM YONG-TAE
分类号 H01L29/41;H01L21/265;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/417;H01L29/423;H01L29/78;H01L29/788;H01L29/792;H01L31/0328;(IPC1-7):H01L31/032 主分类号 H01L29/41
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