发明名称 WORKING METHOD AND WORKING DEVICE OF SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a working method and a working device of a substrate for satisfying quality (work precision and absence of defect in chipping) and cost (work speed and device cost) in removal work for working the surface of a substrate such as a wafer into a high flat shape. SOLUTION: A substrate holding means 12 rotates a workpiece W while it is held. A nozzle moving means 16 moves a nozzle 14 along the surface of the workpiece while work liquid including free abrasive supplied from a work liquid supply means 18 is jetted from the tip of the nozzle 14. Work liquid is applied to the surface of the workpiece W and the workpiece is worked. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005044920(A) 申请公布日期 2005.02.17
申请号 JP20030201581 申请日期 2003.07.25
申请人 ASAHI SUNAC CORP;DOI TOSHIRO 发明人 DOI TOSHIRO;ARA PHILIPOSSIAN;AMARI MASAHIKO;MIYAJI KEIJI;SEIKE YOSHIYUKI
分类号 B24C1/00;B24B1/00;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24C1/00
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