发明名称 |
WORKING METHOD AND WORKING DEVICE OF SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a working method and a working device of a substrate for satisfying quality (work precision and absence of defect in chipping) and cost (work speed and device cost) in removal work for working the surface of a substrate such as a wafer into a high flat shape. SOLUTION: A substrate holding means 12 rotates a workpiece W while it is held. A nozzle moving means 16 moves a nozzle 14 along the surface of the workpiece while work liquid including free abrasive supplied from a work liquid supply means 18 is jetted from the tip of the nozzle 14. Work liquid is applied to the surface of the workpiece W and the workpiece is worked. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005044920(A) |
申请公布日期 |
2005.02.17 |
申请号 |
JP20030201581 |
申请日期 |
2003.07.25 |
申请人 |
ASAHI SUNAC CORP;DOI TOSHIRO |
发明人 |
DOI TOSHIRO;ARA PHILIPOSSIAN;AMARI MASAHIKO;MIYAJI KEIJI;SEIKE YOSHIYUKI |
分类号 |
B24C1/00;B24B1/00;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
B24C1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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