| 摘要 |
<p>Method for examining a surface (12) or a layer in which polarized visual radiation (18) is used to illuminate the surface or layer and measurement radiation (36) reflected or scattered originating from locations (38) on the surface is measured to determine surface polarization properties. Independent claims are also included for the following:- (a) a device for examining the polarization properties of a surface and; (b) a sensor for measuring optical radiation with a field of photodetector elements over which a polarization filter, especially in the form of a metal, is applied.</p> |
