发明名称 Self aligned double gate transistor having a strained channel region and process therefor
摘要 A method of manufacturing an integrated circuit with a strained semiconductor channel region. The method can provide a double gate structure. The gate structure can be provided in and above a trench. The trench can be formed in a compound semiconductor material such as a silicon-germanium material. The strained semiconductor can increase the charge mobility associated with the transistor. A silicon-on-insulator substrate can be used.
申请公布号 US6855982(B1) 申请公布日期 2005.02.15
申请号 US20040770163 申请日期 2004.02.02
申请人 ADVANCED MICRO DEVICES, INC. 发明人 XIANG QI;PAN JAMES N.;LIN MING REN
分类号 H01L21/336;H01L29/51;H01L29/786;(IPC1-7):H11L29/76 主分类号 H01L21/336
代理机构 代理人
主权项
地址