发明名称 Method for making contact with a doping region of a semiconductor component
摘要 A method makes contact with a doping region formed at a substrate surface of a substrate. An insulating layer is applied on the substrate surface and a contact hole is formed in the insulating layer. A metal-containing layer is subsequently deposited on the insulating layer and the surface region of the doping region that is uncovered by the contact hole. In a subsequent thermal process having two steps, first the metal-containing layer is reacted with the silicon of the doping region to form a metal silicide layer and then the rest of the metal-containing layer is converted into a metal-nitride-containing layer in a second thermal step.
申请公布号 US6855630(B1) 申请公布日期 2005.02.15
申请号 US20030614430 申请日期 2003.07.07
申请人 INFINEON TECHNOLOGIES AG 发明人 RUF ALEXANDER;URBANSKY NORBERT;CLAUSSEN WILHELM;GAERTNER THOMAS;SCHMIDBAUER SVEN
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/44;H01L21/336 主分类号 H01L21/285
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